TEST_NAME : Wafer
TEST_DATE : 24_09_11-20_44_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-011-026-01 | FUSED_ID : 6359364768398094753
  IC_TEMP :  -53.28 | VDDM : 1115.64 | AUX_INT :   -8.23 | CsaBias :   67.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09595e-03 / 2
  ADC_P0  : -8.22826e-03 ± 2.24120e-02
  ADC_P1  : 8.51267e-03 ± 5.59698e-04
  ADC_P2  : -5.90023e-06 ± 2.77514e-06
  CSA_Chi2/NDF : 1.43462e-04 / 2
  CSA_P0  : 5.98603e-02 ± 7.98898e-03
  CSA_P1  : 9.47928e-03 ± 6.01912e-04
  CSA_P2  : -4.10840e-05 ± 9.16641e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [10, 25, 39, 58, 84, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [7, 76, 108, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4199', '1.800', '0.1484', '1.799', '0.0936', '7.000', '0.7080', 1, 1, 1, 1, 1726080281.4876864]
VI_after__Init : ['1.201', '0.4199', '1.800', '0.1483', '1.800', '0.0880', '7.000', '0.7078', 1, 1, 1, 1, 1726080289.5220382]
VI_at__the_End : ['1.195', '0.4905', '1.800', '0.1370', '1.800', '0.1132', '7.000', '0.7087', 1, 1, 1, 1, 1726080349.995207]