TEST_NAME : Wafer
TEST_DATE : 24_09_11-20_43_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-011-027-01 | FUSED_ID : 6359364768398094769
  IC_TEMP :  -55.46 | VDDM : 1126.77 | AUX_INT :   -6.55 | CsaBias :   75.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.83187e-04 / 2
  ADC_P0  : -6.54699e-03 ± 2.00938e-02
  ADC_P1  : 8.27938e-03 ± 4.87755e-04
  ADC_P2  : -5.97535e-06 ± 2.33079e-06
  CSA_Chi2/NDF : 8.04092e-05 / 2
  CSA_P0  : 5.72157e-02 ± 5.98102e-03
  CSA_P1  : 9.06059e-03 ± 4.50627e-04
  CSA_P2  : -3.47163e-05 ± 6.86251e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [39, 53, 65, 66]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [26, 33, 72, 85, 95, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3173', '1.800', '0.1347', '1.800', '0.0945', '7.000', '0.7086', 1, 1, 1, 1, 1726080184.5499947]
VI_after__Init : ['1.201', '0.3174', '1.800', '0.1347', '1.800', '0.0863', '7.000', '0.7074', 1, 1, 1, 1, 1726080192.7193923]
VI_at__the_End : ['1.202', '0.4872', '1.800', '0.1357', '1.800', '0.1124', '7.000', '0.7088', 1, 1, 1, 1, 1726080259.718362]