TEST_NAME : Wafer
TEST_DATE : 24_09_11-21_26_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-012-003-14 | FUSED_ID : 6359364768398098494
  IC_TEMP :  -52.83 | VDDM : 1126.60 | AUX_INT :  -18.67 | CsaBias :   73.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.85569e-03 / 2
  ADC_P0  : -1.86728e-02 ± 2.97472e-02
  ADC_P1  : 8.42680e-03 ± 7.15666e-04
  ADC_P2  : -6.15257e-06 ± 3.42045e-06
  CSA_Chi2/NDF : 1.19197e-04 / 2
  CSA_P0  : 5.85023e-02 ± 7.28207e-03
  CSA_P1  : 1.00550e-02 ± 5.48652e-04
  CSA_P2  : -4.52090e-05 ± 8.35532e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [12, 26, 50, 59, 110, 113, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [26, 38, 86, 87]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3464', '1.800', '0.1176', '1.800', '0.0845', '7.000', '0.7081', 1, 1, 1, 1, 1726082802.4988453]
VI_after__Init : ['1.202', '0.3466', '1.800', '0.1176', '1.800', '0.0793', '7.000', '0.7080', 1, 1, 1, 1, 1726082811.332103]
VI_at__the_End : ['1.202', '0.5062', '1.800', '0.1415', '1.800', '0.1120', '7.000', '0.7087', 1, 1, 1, 1, 1726082875.6132233]