TEST_NAME : Wafer
TEST_DATE : 24_09_11-21_29_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-012-005-14 | FUSED_ID : 6359364768398098526
  IC_TEMP :  -48.25 | VDDM : 1132.79 | AUX_INT :   -5.15 | CsaBias :   81.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.55285e-04 / 2
  ADC_P0  : -5.14688e-03 ± 1.98315e-02
  ADC_P1  : 7.90260e-03 ± 4.74284e-04
  ADC_P2  : -4.43332e-06 ± 2.24296e-06
  CSA_Chi2/NDF : 7.52250e-05 / 2
  CSA_P0  : 6.05053e-02 ± 5.78500e-03
  CSA_P1  : 9.26465e-03 ± 4.35858e-04
  CSA_P2  : -3.52318e-05 ± 6.63760e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [17, 60, 75, 76, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [3, 14, 92, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3533', '1.800', '0.1522', '1.800', '0.0854', '7.000', '0.7083', 1, 1, 1, 1, 1726082996.845034]
VI_after__Init : ['1.202', '0.3533', '1.800', '0.1522', '1.800', '0.0797', '7.000', '0.7078', 1, 1, 1, 1, 1726083004.9414682]
VI_at__the_End : ['1.202', '0.5016', '1.800', '0.1429', '1.800', '0.1105', '7.000', '0.7087', 1, 1, 1, 1, 1726083073.6582127]