TEST_NAME : Wafer
TEST_DATE : 24_09_11-21_33_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-012-007-14 | FUSED_ID : 6359364768398098558
  IC_TEMP :  -56.37 | VDDM : 1120.05 | AUX_INT :  -10.25 | CsaBias :   73.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.85569e-03 / 2
  ADC_P0  : -1.02522e-02 ± 2.92220e-02
  ADC_P1  : 8.41449e-03 ± 7.09076e-04
  ADC_P2  : -6.15257e-06 ± 3.42045e-06
  CSA_Chi2/NDF : 1.16061e-04 / 2
  CSA_P0  : 5.90722e-02 ± 7.18565e-03
  CSA_P1  : 9.76499e-03 ± 5.41387e-04
  CSA_P2  : -4.48158e-05 ± 8.24468e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [2, 3, 4, 19, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [2, 25, 34, 73, 82, 87, 114, 123, 124, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1499', '1.800', '0.1611', '1.800', '0.0827', '7.000', '0.7081', 1, 1, 1, 1, 1726083190.6812637]
VI_after__Init : ['1.202', '0.1500', '1.800', '0.1610', '1.800', '0.0775', '7.000', '0.7079', 1, 1, 1, 1, 1726083198.756718]
VI_at__the_End : ['1.202', '0.4926', '1.800', '0.1398', '1.800', '0.1134', '7.000', '0.7088', 1, 1, 1, 1, 1726083267.6564357]