TEST_NAME : Wafer
TEST_DATE : 24_09_11-21_34_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-012-008-14 | FUSED_ID : 6359364768398098574
  IC_TEMP :  -49.16 | VDDM : 1130.50 | AUX_INT :   -5.56 | CsaBias :   91.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.43090e-04 / 2
  ADC_P0  : -5.56217e-03 ± 1.84706e-02
  ADC_P1  : 8.15190e-03 ± 4.56151e-04
  ADC_P2  : -4.74936e-06 ± 2.22430e-06
  CSA_Chi2/NDF : 7.20469e-05 / 2
  CSA_P0  : 6.04680e-02 ± 5.66148e-03
  CSA_P1  : 9.34170e-03 ± 4.26552e-04
  CSA_P2  : -3.65114e-05 ± 6.49588e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [9, 61, 98, 99, 102, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [9, 33, 52, 88, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3775', '1.800', '0.1527', '1.800', '0.0886', '7.000', '0.7080', 1, 1, 1, 1, 1726083287.2129114]
VI_after__Init : ['1.202', '0.3774', '1.800', '0.1526', '1.800', '0.0835', '7.000', '0.7079', 1, 1, 1, 1, 1726083295.282312]
VI_at__the_End : ['1.202', '0.4994', '1.800', '0.1412', '1.800', '0.1089', '7.000', '0.7090', 1, 1, 1, 1, 1726083362.496125]