TEST_NAME : Wafer
TEST_DATE : 24_09_11-21_38_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-012-010-14 | FUSED_ID : 6359364768398098606
  IC_TEMP :  -55.98 | VDDM : 1127.35 | AUX_INT :   -6.52 | CsaBias :   76.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00677e-03 / 2
  ADC_P0  : -6.52201e-03 ± 2.14832e-02
  ADC_P1  : 8.31826e-03 ± 5.26625e-04
  ADC_P2  : -5.64838e-06 ± 2.55622e-06
  CSA_Chi2/NDF : 1.19412e-04 / 2
  CSA_P0  : 6.06254e-02 ± 7.28864e-03
  CSA_P1  : 9.80257e-03 ± 5.49147e-04
  CSA_P2  : -4.50596e-05 ± 8.36285e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [31, 52, 80, 84, 92, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [17, 50, 84, 87]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4788', '1.800', '0.1530', '1.800', '0.0989', '7.000', '0.7082', 1, 1, 1, 1, 1726083481.499103]
VI_after__Init : ['1.202', '0.4785', '1.800', '0.1530', '1.800', '0.0932', '7.000', '0.7079', 1, 1, 1, 1, 1726083490.4034123]
VI_at__the_End : ['1.201', '0.4940', '1.800', '0.1422', '1.800', '0.1140', '7.000', '0.7087', 1, 1, 1, 1, 1726083556.4292898]