TEST_NAME : Wafer
TEST_DATE : 24_09_11-21_39_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-012-011-14 | FUSED_ID : 6359364768398098622
  IC_TEMP :  -50.91 | VDDM : 1126.32 | AUX_INT :   -8.92 | CsaBias :   88.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38249e-03 / 2
  ADC_P0  : -8.92421e-03 ± 2.52209e-02
  ADC_P1  : 8.14035e-03 ± 6.02764e-04
  ADC_P2  : -5.26579e-06 ± 2.86631e-06
  CSA_Chi2/NDF : 1.22146e-04 / 2
  CSA_P0  : 5.96564e-02 ± 7.37159e-03
  CSA_P1  : 1.01438e-02 ± 5.55396e-04
  CSA_P2  : -4.78551e-05 ± 8.45803e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [8, 9, 24, 52, 59, 107, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [18, 55, 70, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1867', '1.800', '0.1501', '1.800', '0.0919', '7.000', '0.7082', 1, 1, 1, 1, 1726083578.679675]
VI_after__Init : ['1.202', '0.1868', '1.800', '0.1501', '1.800', '0.0863', '7.000', '0.7081', 1, 1, 1, 1, 1726083586.7419267]
VI_at__the_End : ['1.202', '0.5044', '1.800', '0.1398', '1.800', '0.1112', '7.000', '0.7087', 1, 1, 1, 1, 1726083654.4958382]