TEST_NAME : Wafer
TEST_DATE : 24_09_11-21_41_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-012-012-14 | FUSED_ID : 6359364768398098638
  IC_TEMP :  -50.03 | VDDM : 1134.46 | AUX_INT :   -4.89 | CsaBias :   79.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.93382e-04 / 2
  ADC_P0  : -4.88834e-03 ± 1.64366e-02
  ADC_P1  : 8.47800e-03 ± 4.09424e-04
  ADC_P2  : -6.46223e-06 ± 1.99738e-06
  CSA_Chi2/NDF : 5.92204e-05 / 2
  CSA_P0  : 6.15771e-02 ± 5.13284e-03
  CSA_P1  : 9.25507e-03 ± 3.86723e-04
  CSA_P2  : -3.57133e-05 ± 5.88933e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [0, 21, 27, 60, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [0, 4, 88, 122, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1894', '1.800', '0.1696', '1.800', '0.0887', '7.000', '0.7080', 1, 1, 1, 1, 1726083675.9612067]
VI_after__Init : ['1.202', '0.1891', '1.800', '0.1695', '1.800', '0.0831', '7.000', '0.7079', 1, 1, 1, 1, 1726083684.1976054]
VI_at__the_End : ['1.202', '0.5002', '1.800', '0.1416', '1.800', '0.1115', '7.000', '0.7086', 1, 1, 1, 1, 1726083752.0652854]