TEST_NAME : Wafer
TEST_DATE : 24_09_11-21_42_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-012-013-14 | FUSED_ID : 6359364768398098654
  IC_TEMP :  -51.96 | VDDM : 1129.07 | AUX_INT :   -7.08 | CsaBias :   90.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08332e-03 / 2
  ADC_P0  : -7.08400e-03 ± 2.22542e-02
  ADC_P1  : 8.23191e-03 ± 5.30051e-04
  ADC_P2  : -6.08271e-06 ± 2.49708e-06
  CSA_Chi2/NDF : 8.40851e-05 / 2
  CSA_P0  : 6.10695e-02 ± 6.11620e-03
  CSA_P1  : 9.66867e-03 ± 4.60812e-04
  CSA_P2  : -4.10122e-05 ± 7.01762e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [53, 60, 72, 88, 89]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [1, 9, 18, 26, 28, 53, 61, 66, 83, 106, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3054', '1.800', '0.1754', '1.800', '0.0872', '7.000', '0.7087', 1, 1, 1, 1, 1726083773.2587655]
VI_after__Init : ['1.202', '0.3056', '1.800', '0.1754', '1.800', '0.0798', '7.000', '0.7080', 1, 1, 1, 1, 1726083781.3111584]
VI_at__the_End : ['1.202', '0.5042', '1.800', '0.1403', '1.800', '0.1104', '7.000', '0.7089', 1, 1, 1, 1, 1726083842.680502]