TEST_NAME : Wafer
TEST_DATE : 24_09_11-21_44_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-012-014-14 | FUSED_ID : 6359364768398098670
  IC_TEMP :  -48.64 | VDDM : 1128.91 | AUX_INT :   -5.95 | CsaBias :   92.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.54764e-04 / 2
  ADC_P0  : -5.95133e-03 ± 2.09368e-02
  ADC_P1  : 8.27082e-03 ± 5.16009e-04
  ADC_P2  : -5.29361e-06 ± 2.51632e-06
  CSA_Chi2/NDF : 6.81632e-05 / 2
  CSA_P0  : 5.91213e-02 ± 5.50678e-03
  CSA_P1  : 9.35666e-03 ± 4.14896e-04
  CSA_P2  : -3.75897e-05 ± 6.31837e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [20, 23, 26, 31, 41, 80, 82, 90, 92]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [0, 6, 56, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1596', '1.800', '0.1387', '1.800', '0.0843', '7.000', '0.7080', 1, 1, 1, 1, 1726083870.0423994]
VI_after__Init : ['1.202', '0.1595', '1.800', '0.1386', '1.800', '0.0786', '7.000', '0.7079', 1, 1, 1, 1, 1726083878.9756477]
VI_at__the_End : ['1.202', '0.4969', '1.800', '0.1374', '1.800', '0.1107', '7.000', '0.7090', 1, 1, 1, 1, 1726083943.6877325]