TEST_NAME : Wafer
TEST_DATE : 24_09_11-21_54_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-012-020-09 | FUSED_ID : 6359364768398098761
  IC_TEMP :  -54.02 | VDDM : 1136.24 | AUX_INT :   -6.47 | CsaBias :   74.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04097e-03 / 2
  ADC_P0  : -6.46545e-03 ± 2.18572e-02
  ADC_P1  : 8.12518e-03 ± 5.27165e-04
  ADC_P2  : -5.39383e-06 ± 2.50357e-06
  CSA_Chi2/NDF : 5.85809e-05 / 2
  CSA_P0  : 5.96112e-02 ± 5.10505e-03
  CSA_P1  : 8.99430e-03 ± 3.84629e-04
  CSA_P2  : -3.46418e-05 ± 5.85744e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [4, 7, 9, 18, 54, 62, 82, 89, 109, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [7, 37, 56, 68, 83, 86, 97, 98, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3264', '1.800', '0.1519', '1.800', '0.0937', '7.000', '0.7080', 1, 1, 1, 1, 1726084452.876796]
VI_after__Init : ['1.202', '0.3264', '1.800', '0.1519', '1.800', '0.0880', '7.000', '0.7079', 1, 1, 1, 1, 1726084460.925147]
VI_at__the_End : ['1.201', '0.4860', '1.800', '0.1362', '1.800', '0.1128', '7.000', '0.7090', 1, 1, 1, 1, 1726084519.9268382]