TEST_NAME : Wafer
TEST_DATE : 24_09_11-22_00_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-012-024-09 | FUSED_ID : 6359364768398098825
  IC_TEMP :  -49.23 | VDDM : 1129.36 | AUX_INT :   -7.41 | CsaBias :   80.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.87331e-04 / 2
  ADC_P0  : -7.40831e-03 ± 2.01199e-02
  ADC_P1  : 8.02349e-03 ± 4.68288e-04
  ADC_P2  : -5.74175e-06 ± 2.15440e-06
  CSA_Chi2/NDF : 7.25251e-05 / 2
  CSA_P0  : 5.92126e-02 ± 5.68024e-03
  CSA_P1  : 9.24653e-03 ± 4.27965e-04
  CSA_P2  : -3.48552e-05 ± 6.51740e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [4, 30, 50, 51, 63, 69, 103, 111, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [1, 33, 44, 85, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3387', '1.800', '0.1886', '1.800', '0.0885', '7.000', '0.7082', 1, 1, 1, 1, 1726084840.1291404]
VI_after__Init : ['1.202', '0.3388', '1.800', '0.1886', '1.800', '0.0834', '7.000', '0.7079', 1, 1, 1, 1, 1726084848.2495627]
VI_at__the_End : ['1.201', '0.5028', '1.800', '0.1374', '1.800', '0.1098', '7.000', '0.7087', 1, 1, 1, 1, 1726084905.7502599]