TEST_NAME : Wafer
TEST_DATE : 24_09_11-22_44_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-013-003-03 | FUSED_ID : 6359364768398102579
  IC_TEMP :  -53.75 | VDDM : 1133.85 | AUX_INT :   -6.82 | CsaBias :   83.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.24955e-04 / 2
  ADC_P0  : -6.81629e-03 ± 1.81691e-02
  ADC_P1  : 8.26564e-03 ± 4.36286e-04
  ADC_P2  : -6.11320e-06 ± 2.06789e-06
  CSA_Chi2/NDF : 1.04851e-04 / 2
  CSA_P0  : 5.80855e-02 ± 6.82980e-03
  CSA_P1  : 9.11351e-03 ± 5.14576e-04
  CSA_P2  : -3.41687e-05 ± 7.83639e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [1, 39, 69, 92, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [9, 60, 101, 113, 115, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2545', '1.800', '0.1689', '1.800', '0.0881', '7.000', '0.7078', 1, 1, 1, 1, 1726087457.7825081]
VI_after__Init : ['1.202', '0.2546', '1.800', '0.1690', '1.800', '0.0824', '7.000', '0.7076', 1, 1, 1, 1, 1726087465.8408115]
VI_at__the_End : ['1.202', '0.4931', '1.800', '0.1356', '1.800', '0.1124', '7.000', '0.7086', 1, 1, 1, 1, 1726087533.4457264]