TEST_NAME : Wafer
TEST_DATE : 24_09_11-22_42_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-013-004-03 | FUSED_ID : 6359364768398102595
  IC_TEMP :  -49.83 | VDDM : 1105.22 | AUX_INT :   -8.57 | CsaBias :   78.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38405e-03 / 2
  ADC_P0  : -8.57051e-03 ± 2.52369e-02
  ADC_P1  : 7.96704e-03 ± 5.92499e-04
  ADC_P2  : -5.04052e-06 ± 2.76054e-06
  CSA_Chi2/NDF : 7.07110e-05 / 2
  CSA_P0  : 5.88088e-02 ± 5.60875e-03
  CSA_P1  : 9.47956e-03 ± 4.22579e-04
  CSA_P2  : -3.82621e-05 ± 6.43537e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [5, 15, 38, 60, 65, 72, 108, 110, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [5, 14, 73, 78]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2494', '1.800', '0.1567', '1.800', '0.0914', '7.000', '0.7076', 1, 1, 1, 1, 1726087360.6428492]
VI_after__Init : ['1.202', '0.2495', '1.800', '0.1567', '1.800', '0.0860', '7.000', '0.7076', 1, 1, 1, 1, 1726087368.6632297]
VI_at__the_End : ['1.201', '0.5002', '1.800', '0.1367', '1.800', '0.1112', '7.000', '0.7084', 1, 1, 1, 1, 1726087434.8492723]