TEST_NAME : Wafer
TEST_DATE : 24_09_11-22_41_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-013-005-03 | FUSED_ID : 6359364768398102611
  IC_TEMP :  -56.38 | VDDM : 1112.14 | AUX_INT :   -7.87 | CsaBias :   76.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05759e-03 / 2
  ADC_P0  : -7.87321e-03 ± 2.20093e-02
  ADC_P1  : 8.53269e-03 ± 5.47836e-04
  ADC_P2  : -6.21447e-06 ± 2.70095e-06
  CSA_Chi2/NDF : 1.38203e-04 / 2
  CSA_P0  : 5.87249e-02 ± 7.84118e-03
  CSA_P1  : 1.02842e-02 ± 5.90776e-04
  CSA_P2  : -4.84721e-05 ± 8.99683e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [23, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [13, 47, 80, 87, 88, 93, 119, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4241', '1.800', '0.1352', '1.800', '0.0982', '7.000', '0.7076', 1, 1, 1, 1, 1726087264.3173542]
VI_after__Init : ['1.202', '0.4246', '1.800', '0.1352', '1.800', '0.0924', '7.000', '0.7076', 1, 1, 1, 1, 1726087272.355801]
VI_at__the_End : ['1.202', '0.5101', '1.800', '0.1420', '1.800', '0.1114', '7.000', '0.7083', 1, 1, 1, 1, 1726087339.1606593]