TEST_NAME : Wafer
TEST_DATE : 24_09_11-22_39_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-013-006-03 | FUSED_ID : 6359364768398102627
  IC_TEMP :  -58.18 | VDDM : 1128.98 | AUX_INT : -108.25 | CsaBias :   -8.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.51502e-03 / 2
  ADC_P0  : -1.08249e-01 ± 3.19372e-02
  ADC_P1  : 1.01044e-02 ± 7.69414e-04
  ADC_P2  : -1.17887e-05 ± 3.62961e-06
  CSA_Chi2/NDF : 1.41343e-04 / 2
  CSA_P0  : 6.03112e-02 ± 7.92974e-03
  CSA_P1  : 9.44273e-03 ± 5.97449e-04
  CSA_P2  : -4.34199e-05 ± 9.09844e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [32, 39, 72, 78, 88, 120, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [17, 22, 39, 81, 101, 110, 112, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1923', '1.800', '0.1203', '1.800', '0.0884', '7.000', '0.7084', 1, 1, 1, 1, 1726087166.711912]
VI_after__Init : ['1.201', '0.1920', '1.800', '0.1201', '1.800', '0.0812', '7.000', '0.7077', 1, 1, 1, 1, 1726087174.933164]
VI_at__the_End : ['1.201', '0.4777', '1.800', '0.1370', '1.799', '0.1158', '7.000', '0.7084', 1, 1, 1, 1, 1726087243.4708896]