TEST_NAME : Wafer
TEST_DATE : 24_09_11-22_37_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-013-007-03 | FUSED_ID : 6359364768398102643
  IC_TEMP :  -55.30 | VDDM : 1125.63 | AUX_INT :   -8.86 | CsaBias :   83.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30442e-03 / 2
  ADC_P0  : -8.85965e-03 ± 2.44536e-02
  ADC_P1  : 8.46071e-03 ± 5.98257e-04
  ADC_P2  : -6.27496e-06 ± 2.90379e-06
  CSA_Chi2/NDF : 1.35529e-04 / 2
  CSA_P0  : 5.82934e-02 ± 7.76495e-03
  CSA_P1  : 9.84426e-03 ± 5.85033e-04
  CSA_P2  : -4.48966e-05 ± 8.90936e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [64, 75, 101, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [29, 31, 37, 57, 60, 65, 68, 110, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2354', '1.800', '0.1487', '1.800', '0.0915', '7.000', '0.7078', 1, 1, 1, 1, 1726087069.4993463]
VI_after__Init : ['1.202', '0.2355', '1.800', '0.1487', '1.800', '0.0858', '7.000', '0.7077', 1, 1, 1, 1, 1726087078.2667012]
VI_at__the_End : ['1.202', '0.4962', '1.800', '0.1395', '1.800', '0.1132', '7.000', '0.7083', 1, 1, 1, 1, 1726087145.7805529]