TEST_NAME : Wafer
TEST_DATE : 24_09_11-22_31_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-013-011-03 | FUSED_ID : 6359364768398102707
  IC_TEMP :  -48.96 | VDDM : 1108.48 | AUX_INT :   -7.58 | CsaBias :   89.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.85754e-04 / 2
  ADC_P0  : -7.58138e-03 ± 2.12507e-02
  ADC_P1  : 8.19069e-03 ± 5.10423e-04
  ADC_P2  : -5.58010e-06 ± 2.42872e-06
  CSA_Chi2/NDF : 9.96992e-05 / 2
  CSA_P0  : 5.96104e-02 ± 6.65991e-03
  CSA_P1  : 9.72593e-03 ± 5.01776e-04
  CSA_P2  : -4.20066e-05 ± 7.64146e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [5, 12, 24, 41, 45, 72, 104, 113, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [19, 25, 41, 62, 88, 91, 105, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4753', '1.800', '0.1715', '1.800', '0.0977', '7.000', '0.7072', 1, 1, 1, 1, 1726086681.706409]
VI_after__Init : ['1.202', '0.4756', '1.800', '0.1718', '1.800', '0.0922', '7.000', '0.7072', 1, 1, 1, 1, 1726086689.8737671]
VI_at__the_End : ['1.202', '0.5004', '1.800', '0.1396', '1.800', '0.1123', '7.000', '0.7081', 1, 1, 1, 1, 1726086757.2563975]