TEST_NAME : Wafer
TEST_DATE : 24_09_11-22_29_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-013-012-03 | FUSED_ID : 6359364768398102723
  IC_TEMP :  -47.26 | VDDM : 1110.60 | AUX_INT :  -26.14 | CsaBias :   81.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52246e-03 / 2
  ADC_P0  : -2.61409e-02 ± 2.74164e-02
  ADC_P1  : 8.34174e-03 ± 6.53745e-04
  ADC_P2  : -5.67885e-06 ± 3.09885e-06
  CSA_Chi2/NDF : 8.38135e-05 / 2
  CSA_P0  : 5.98773e-02 ± 6.10632e-03
  CSA_P1  : 9.29320e-03 ± 4.60067e-04
  CSA_P2  : -3.60128e-05 ± 7.00627e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [62]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [23, 40, 62, 63, 66, 79, 85, 112, 118, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2330', '1.800', '0.1669', '1.800', '0.0850', '7.000', '0.7072', 1, 1, 1, 1, 1726086584.336978]
VI_after__Init : ['1.202', '0.2332', '1.800', '0.1669', '1.800', '0.0793', '7.000', '0.7072', 1, 1, 1, 1, 1726086592.4303474]
VI_at__the_End : ['1.202', '0.4997', '1.800', '0.1377', '1.800', '0.1121', '7.000', '0.7081', 1, 1, 1, 1, 1726086658.803213]