TEST_NAME : Wafer
TEST_DATE : 24_09_11-22_28_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-013-013-03 | FUSED_ID : 6359364768398102739
  IC_TEMP :  -52.05 | VDDM : 1129.45 | AUX_INT :   -7.06 | CsaBias :   88.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.18492e-04 / 2
  ADC_P0  : -7.05911e-03 ± 2.05213e-02
  ADC_P1  : 8.00276e-03 ± 4.85685e-04
  ADC_P2  : -5.12443e-06 ± 2.27649e-06
  CSA_Chi2/NDF : 7.76143e-05 / 2
  CSA_P0  : 6.17010e-02 ± 5.87616e-03
  CSA_P1  : 9.38385e-03 ± 4.42726e-04
  CSA_P2  : -3.85193e-05 ± 6.74219e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [26, 61, 75, 77]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [1, 5, 17, 19, 90, 104, 115, 123, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2030', '1.800', '0.1633', '1.800', '0.0922', '7.000', '0.7072', 1, 1, 1, 1, 1726086487.072586]
VI_after__Init : ['1.201', '0.2030', '1.800', '0.1630', '1.800', '0.0869', '7.000', '0.7073', 1, 1, 1, 1, 1726086495.9378831]
VI_at__the_End : ['1.202', '0.4953', '1.800', '0.1397', '1.800', '0.1121', '7.000', '0.7082', 1, 1, 1, 1, 1726086562.681663]