TEST_NAME : Wafer
TEST_DATE : 24_09_11-22_20_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-013-018-04 | FUSED_ID : 6359364768398102820
  IC_TEMP :  -45.30 | VDDM : 1124.16 | AUX_INT :   -7.66 | CsaBias :   92.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.69263e-04 / 2
  ADC_P0  : -7.65993e-03 ± 2.10675e-02
  ADC_P1  : 7.74083e-03 ± 4.79556e-04
  ADC_P2  : -4.89038e-06 ± 2.16370e-06
  CSA_Chi2/NDF : 4.96958e-05 / 2
  CSA_P0  : 5.79594e-02 ± 4.70199e-03
  CSA_P1  : 9.14985e-03 ± 3.54261e-04
  CSA_P2  : -3.47707e-05 ± 5.39498e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [49, 68, 91, 113, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [10, 20, 40, 55, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2995', '1.800', '0.1480', '1.800', '0.0914', '7.000', '0.7074', 1, 1, 1, 1, 1726086002.5384226]
VI_after__Init : ['1.202', '0.2995', '1.800', '0.1478', '1.800', '0.0857', '7.000', '0.7070', 1, 1, 1, 1, 1726086011.2247205]
VI_at__the_End : ['1.202', '0.4940', '1.800', '0.1343', '1.800', '0.1089', '7.000', '0.7081', 1, 1, 1, 1, 1726086079.3966167]