TEST_NAME : Wafer
TEST_DATE : 24_09_11-22_11_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-013-023-04 | FUSED_ID : 6359364768398102900
  IC_TEMP :  -50.47 | VDDM : 1131.48 | AUX_INT :   -7.62 | CsaBias :   90.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20280e-03 / 2
  ADC_P0  : -7.62021e-03 ± 2.35018e-02
  ADC_P1  : 8.23023e-03 ± 5.67586e-04
  ADC_P2  : -5.68512e-06 ± 2.71048e-06
  CSA_Chi2/NDF : 8.52152e-05 / 2
  CSA_P0  : 6.01253e-02 ± 6.15717e-03
  CSA_P1  : 9.50649e-03 ± 4.63898e-04
  CSA_P2  : -3.80456e-05 ± 7.06462e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [2, 75, 80, 120, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [4, 36, 37, 61, 90, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4117', '1.800', '0.1548', '1.800', '0.0888', '7.000', '0.7077', 1, 1, 1, 1, 1726085518.2090576]
VI_after__Init : ['1.201', '0.4116', '1.800', '0.1548', '1.800', '0.0835', '7.000', '0.7077', 1, 1, 1, 1, 1726085526.3495157]
VI_at__the_End : ['1.202', '0.5049', '1.800', '0.1395', '1.800', '0.1116', '7.000', '0.7083', 1, 1, 1, 1, 1726085588.7558453]