TEST_NAME : Wafer
TEST_DATE : 24_09_11-22_10_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-013-024-04 | FUSED_ID : 6359364768398102916
  IC_TEMP :  -47.41 | VDDM : 1133.14 | AUX_INT :   -7.17 | CsaBias :   92.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02367e-03 / 2
  ADC_P0  : -7.16550e-03 ± 2.16966e-02
  ADC_P1  : 7.73065e-03 ± 5.00467e-04
  ADC_P2  : -4.50861e-06 ± 2.28757e-06
  CSA_Chi2/NDF : 7.74610e-05 / 2
  CSA_P0  : 5.87299e-02 ± 5.87035e-03
  CSA_P1  : 8.82542e-03 ± 4.42288e-04
  CSA_P2  : -2.99341e-05 ± 6.73553e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [38, 79, 89, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [44, 58, 72, 75, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2655', '1.800', '0.1648', '1.800', '0.0908', '7.000', '0.7079', 1, 1, 1, 1, 1726085421.7103522]
VI_after__Init : ['1.202', '0.2655', '1.800', '0.1649', '1.800', '0.0851', '7.000', '0.7077', 1, 1, 1, 1, 1726085429.8089018]
VI_at__the_End : ['1.201', '0.4945', '1.800', '0.1344', '1.800', '0.1095', '7.000', '0.7085', 1, 1, 1, 1, 1726085496.6046762]