TEST_NAME : Wafer
TEST_DATE : 24_09_11-22_08_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-013-025-04 | FUSED_ID : 6359364768398102932
  IC_TEMP :  -45.72 | VDDM : 1122.05 | AUX_INT :   -4.89 | CsaBias :   95.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16867e-03 / 2
  ADC_P0  : -4.89241e-03 ± 2.32101e-02
  ADC_P1  : 7.79175e-03 ± 5.48006e-04
  ADC_P2  : -4.42792e-06 ± 2.54792e-06
  CSA_Chi2/NDF : 8.27719e-05 / 2
  CSA_P0  : 5.78472e-02 ± 6.06825e-03
  CSA_P1  : 9.23222e-03 ± 4.57199e-04
  CSA_P2  : -3.33457e-05 ± 6.96260e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [8, 23, 56, 96, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [64, 71, 80, 102, 105, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3318', '1.800', '0.1657', '1.800', '0.0849', '7.000', '0.7077', 1, 1, 1, 1, 1726085324.0428355]
VI_after__Init : ['1.202', '0.3318', '1.800', '0.1657', '1.800', '0.0796', '7.000', '0.7079', 1, 1, 1, 1, 1726085332.761173]
VI_at__the_End : ['1.202', '0.5039', '1.800', '0.1365', '1.800', '0.1093', '7.000', '0.7083', 1, 1, 1, 1, 1726085400.6869903]