TEST_NAME : Wafer
TEST_DATE : 24_09_11-22_55_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-014-009-13 | FUSED_ID : 6359364768398106781
  IC_TEMP :  -55.26 | VDDM : 1123.55 | AUX_INT :   -6.60 | CsaBias :   79.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.85067e-04 / 2
  ADC_P0  : -6.60393e-03 ± 2.12452e-02
  ADC_P1  : 7.85363e-03 ± 4.93023e-04
  ADC_P2  : -4.93846e-06 ± 2.26686e-06
  CSA_Chi2/NDF : 1.93439e-04 / 2
  CSA_P0  : 5.79978e-02 ± 9.27672e-03
  CSA_P1  : 1.01908e-02 ± 6.98934e-04
  CSA_P2  : -4.99444e-05 ± 1.06439e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [17, 37, 66, 73, 79, 87, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [65, 75, 87, 99, 101, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2078', '1.800', '0.1189', '1.800', '0.0887', '7.000', '0.7079', 1, 1, 1, 1, 1726088138.9682405]
VI_after__Init : ['1.202', '0.2080', '1.800', '0.1192', '1.800', '0.0835', '7.000', '0.7079', 1, 1, 1, 1, 1726088147.2135959]
VI_at__the_End : ['1.202', '0.5016', '1.800', '0.1396', '1.800', '0.1132', '7.000', '0.7085', 1, 1, 1, 1, 1726088215.5013502]