TEST_NAME : Wafer
TEST_DATE : 24_09_11-23_10_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-014-018-10 | FUSED_ID : 6359364768398106922
  IC_TEMP :  -56.56 | VDDM : 1127.99 | AUX_INT :   -6.80 | CsaBias :   82.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.30672e-04 / 2
  ADC_P0  : -6.79767e-03 ± 2.05959e-02
  ADC_P1  : 8.20028e-03 ± 4.86371e-04
  ADC_P2  : -6.19336e-06 ± 2.27083e-06
  CSA_Chi2/NDF : 9.40645e-05 / 2
  CSA_P0  : 5.82927e-02 ± 6.46897e-03
  CSA_P1  : 9.54235e-03 ± 4.87390e-04
  CSA_P2  : -4.03544e-05 ± 7.42238e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [104, 111, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [11, 31, 34, 55, 66, 80, 89, 99, 104, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2355', '1.800', '0.1676', '1.800', '0.0854', '7.000', '0.7081', 1, 1, 1, 1, 1726089012.686907]
VI_after__Init : ['1.202', '0.2356', '1.800', '0.1676', '1.800', '0.0796', '7.000', '0.7079', 1, 1, 1, 1, 1726089020.954129]
VI_at__the_End : ['1.202', '0.4972', '1.800', '0.1393', '1.800', '0.1132', '7.000', '0.7085', 1, 1, 1, 1, 1726089082.722367]