TEST_NAME : Wafer
TEST_DATE : 24_09_11-23_13_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-014-020-10 | FUSED_ID : 6359364768398106954
  IC_TEMP :  -48.64 | VDDM : 1125.96 | AUX_INT :   -6.32 | CsaBias :   88.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.57828e-04 / 2
  ADC_P0  : -6.32219e-03 ± 1.86211e-02
  ADC_P1  : 7.93092e-03 ± 4.37903e-04
  ADC_P2  : -5.09203e-06 ± 2.03250e-06
  CSA_Chi2/NDF : 7.31647e-05 / 2
  CSA_P0  : 5.79517e-02 ± 5.70523e-03
  CSA_P1  : 9.45866e-03 ± 4.29848e-04
  CSA_P2  : -3.74003e-05 ± 6.54608e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [34, 45, 53, 56, 58, 59, 71, 76, 80, 100, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [59, 67, 94, 121, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3586', '1.800', '0.1413', '1.800', '0.0882', '7.000', '0.7078', 1, 1, 1, 1, 1726089207.4836226]
VI_after__Init : ['1.201', '0.3586', '1.800', '0.1412', '1.800', '0.0828', '7.000', '0.7077', 1, 1, 1, 1, 1726089215.641953]
VI_at__the_End : ['1.201', '0.5024', '1.800', '0.1358', '1.800', '0.1107', '7.000', '0.7086', 1, 1, 1, 1, 1726089282.9717343]