TEST_NAME : Wafer
TEST_DATE : 24_09_11-23_23_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-014-026-10 | FUSED_ID : 6359364768398107050
  IC_TEMP :  -57.12 | VDDM : 1130.42 | AUX_INT :   -6.40 | CsaBias :   85.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.19545e-04 / 2
  ADC_P0  : -6.40061e-03 ± 1.81005e-02
  ADC_P1  : 8.44355e-03 ± 4.42179e-04
  ADC_P2  : -6.62329e-06 ± 2.12608e-06
  CSA_Chi2/NDF : 9.17973e-05 / 2
  CSA_P0  : 5.61717e-02 ± 6.39054e-03
  CSA_P1  : 9.80339e-03 ± 4.81481e-04
  CSA_P2  : -4.21816e-05 ± 7.33238e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [24, 30, 65, 93, 118, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [7, 9, 49, 52, 61]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1828', '1.800', '0.1777', '1.800', '0.0853', '7.000', '0.7090', 1, 1, 1, 1, 1726089789.3693707]
VI_after__Init : ['1.202', '0.1828', '1.800', '0.1777', '1.800', '0.0774', '7.000', '0.7078', 1, 1, 1, 1, 1726089797.4048162]
VI_at__the_End : ['1.201', '0.5029', '1.800', '0.1378', '1.800', '0.1101', '7.000', '0.7087', 1, 1, 1, 1, 1726089858.703034]