TEST_NAME : Wafer
TEST_DATE : 24_09_11-23_57_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-015-005-00 | FUSED_ID : 6359364768398110800
  IC_TEMP :  -52.21 | VDDM : 1128.91 | AUX_INT :   -5.95 | CsaBias :   84.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.54764e-04 / 2
  ADC_P0  : -5.95133e-03 ± 2.09368e-02
  ADC_P1  : 8.27082e-03 ± 5.16009e-04
  ADC_P2  : -5.29361e-06 ± 2.51632e-06
  CSA_Chi2/NDF : 1.23396e-04 / 2
  CSA_P0  : 5.75893e-02 ± 7.40921e-03
  CSA_P1  : 9.78770e-03 ± 5.58231e-04
  CSA_P2  : -4.34120e-05 ± 8.50120e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [58, 59, 77]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [8, 97, 101, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1578', '1.800', '0.1327', '1.800', '0.0803', '7.000', '0.7079', 1, 1, 1, 1, 1726091824.7077792]
VI_after__Init : ['1.202', '0.1579', '1.800', '0.1326', '1.800', '0.0745', '7.000', '0.7080', 1, 1, 1, 1, 1726091832.7330787]
VI_at__the_End : ['1.202', '0.4986', '1.800', '0.1387', '1.800', '0.1108', '7.000', '0.7086', 1, 1, 1, 1, 1726091892.7384622]