TEST_NAME : Wafer
TEST_DATE : 24_09_11-23_52_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-015-008-00 | FUSED_ID : 6359364768398110848
  IC_TEMP :  -46.93 | VDDM : 1120.87 | AUX_INT :   -7.32 | CsaBias :   88.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14185e-03 / 2
  ADC_P0  : -7.31904e-03 ± 2.29075e-02
  ADC_P1  : 8.05074e-03 ± 5.45058e-04
  ADC_P2  : -5.24862e-06 ± 2.56381e-06
  CSA_Chi2/NDF : 1.05141e-04 / 2
  CSA_P0  : 5.88858e-02 ± 6.83924e-03
  CSA_P1  : 9.45118e-03 ± 5.15287e-04
  CSA_P2  : -3.73583e-05 ± 7.84721e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [13, 32, 79, 112, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [17, 66, 70, 94, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1206', '1.800', '0.1511', '1.800', '0.0838', '7.000', '0.7078', 1, 1, 1, 1, 1726091534.8224802]
VI_after__Init : ['1.202', '0.1207', '1.800', '0.1511', '1.800', '0.0785', '7.000', '0.7081', 1, 1, 1, 1, 1726091542.9608095]
VI_at__the_End : ['1.202', '0.5017', '1.800', '0.1384', '1.800', '0.1098', '7.000', '0.7087', 1, 1, 1, 1, 1726091610.2475264]