TEST_NAME : Wafer
TEST_DATE : 24_09_11-23_49_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-015-010-00 | FUSED_ID : 6359364768398110880
  IC_TEMP :  -48.99 | VDDM : 1130.45 | AUX_INT :   -8.23 | CsaBias :   87.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.62180e-03 / 2
  ADC_P0  : -8.22515e-03 ± 2.73382e-02
  ADC_P1  : 8.02833e-03 ± 6.43957e-04
  ADC_P2  : -5.19969e-06 ± 3.01370e-06
  CSA_Chi2/NDF : 7.03923e-05 / 2
  CSA_P0  : 5.90632e-02 ± 5.59609e-03
  CSA_P1  : 9.26872e-03 ± 4.21625e-04
  CSA_P2  : -3.60179e-05 ± 6.42085e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [52, 107, 113, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [29, 60, 72, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2073', '1.800', '0.1436', '1.800', '0.0850', '7.000', '0.7087', 1, 1, 1, 1, 1726091340.98282]
VI_after__Init : ['1.202', '0.2074', '1.800', '0.1431', '1.800', '0.0776', '7.000', '0.7078', 1, 1, 1, 1, 1726091349.965013]
VI_at__the_End : ['1.202', '0.4961', '1.800', '0.1377', '1.800', '0.1107', '7.000', '0.7086', 1, 1, 1, 1, 1726091417.941754]