TEST_NAME : Wafer
TEST_DATE : 24_09_11-23_47_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-015-011-00 | FUSED_ID : 6359364768398110896
  IC_TEMP :  -51.67 | VDDM : 1134.12 | AUX_INT :   -6.33 | CsaBias :   84.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10403e-03 / 2
  ADC_P0  : -6.32806e-03 ± 2.25549e-02
  ADC_P1  : 8.28325e-03 ± 5.62704e-04
  ADC_P2  : -4.83847e-06 ± 2.78553e-06
  CSA_Chi2/NDF : 1.31288e-04 / 2
  CSA_P0  : 6.15379e-02 ± 7.64249e-03
  CSA_P1  : 9.93711e-03 ± 5.75807e-04
  CSA_P2  : -4.53845e-05 ± 8.76885e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [5, 18, 50, 79, 82, 85, 98, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [17, 62, 65, 80, 88, 110, 114, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3405', '1.800', '0.1703', '1.800', '0.0943', '7.000', '0.7079', 1, 1, 1, 1, 1726091244.0294785]
VI_after__Init : ['1.202', '0.3406', '1.800', '0.1703', '1.800', '0.0887', '7.000', '0.7080', 1, 1, 1, 1, 1726091252.2428668]
VI_at__the_End : ['1.202', '0.5061', '1.800', '0.1432', '1.800', '0.1118', '7.000', '0.7090', 1, 1, 1, 1, 1726091312.4630418]