TEST_NAME : Wafer
TEST_DATE : 24_09_11-23_45_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-015-012-00 | FUSED_ID : 6359364768398110912
  IC_TEMP :  -51.03 | VDDM : 1129.25 | AUX_INT :   -8.19 | CsaBias :   87.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20257e-03 / 2
  ADC_P0  : -8.19468e-03 ± 2.34984e-02
  ADC_P1  : 8.07475e-03 ± 5.57975e-04
  ADC_P2  : -5.28577e-06 ± 2.62704e-06
  CSA_Chi2/NDF : 1.05269e-04 / 2
  CSA_P0  : 5.79823e-02 ± 6.84342e-03
  CSA_P1  : 9.69999e-03 ± 5.15602e-04
  CSA_P2  : -4.14153e-05 ± 7.85202e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [0, 58, 60, 98, 112, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [0, 38, 51, 64, 75]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2226', '1.800', '0.1383', '1.800', '0.0886', '7.000', '0.7079', 1, 1, 1, 1, 1726091147.4841416]
VI_after__Init : ['1.202', '0.2226', '1.800', '0.1382', '1.800', '0.0829', '7.000', '0.7080', 1, 1, 1, 1, 1726091156.2194712]
VI_at__the_End : ['1.202', '0.5009', '1.800', '0.1424', '1.800', '0.1128', '7.000', '0.7084', 1, 1, 1, 1, 1726091222.5171094]