TEST_NAME : Wafer
TEST_DATE : 24_09_11-23_44_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-015-013-00 | FUSED_ID : 6359364768398110928
  IC_TEMP :  -53.32 | VDDM : 1125.64 | AUX_INT :   -7.69 | CsaBias :   88.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30533e-03 / 2
  ADC_P0  : -7.68642e-03 ± 2.45354e-02
  ADC_P1  : 8.06398e-03 ± 5.90674e-04
  ADC_P2  : -4.85278e-06 ± 2.81888e-06
  CSA_Chi2/NDF : 1.35660e-04 / 2
  CSA_P0  : 5.90878e-02 ± 7.76870e-03
  CSA_P1  : 9.70036e-03 ± 5.85316e-04
  CSA_P2  : -4.48028e-05 ± 8.91366e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [36, 66, 69, 73, 85]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [11, 48, 52]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2872', '1.800', '0.1386', '1.800', '0.0880', '7.000', '0.7078', 1, 1, 1, 1, 1726091050.4179463]
VI_after__Init : ['1.202', '0.2873', '1.800', '0.1387', '1.800', '0.0826', '7.000', '0.7079', 1, 1, 1, 1, 1726091058.5273554]
VI_at__the_End : ['1.202', '0.4897', '1.800', '0.1391', '1.800', '0.1122', '7.000', '0.7085', 1, 1, 1, 1, 1726091118.933374]