TEST_NAME : Wafer
TEST_DATE : 24_09_11-23_42_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-015-014-00 | FUSED_ID : 6359364768398110944
  IC_TEMP :  -54.22 | VDDM : 1127.47 | AUX_INT :   -5.64 | CsaBias :   77.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.19327e-04 / 2
  ADC_P0  : -5.63799e-03 ± 1.81035e-02
  ADC_P1  : 8.41522e-03 ± 4.43663e-04
  ADC_P2  : -6.31942e-06 ± 2.14501e-06
  CSA_Chi2/NDF : 1.32622e-04 / 2
  CSA_P0  : 5.95329e-02 ± 7.68121e-03
  CSA_P1  : 9.84929e-03 ± 5.78724e-04
  CSA_P2  : -4.56775e-05 ± 8.81328e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [7, 9, 28, 45, 58, 62, 97, 100, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [18, 28, 63, 80, 84]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2854', '1.800', '0.1567', '1.800', '0.0960', '7.000', '0.7079', 1, 1, 1, 1, 1726090953.5026243]
VI_after__Init : ['1.202', '0.2851', '1.800', '0.1563', '1.800', '0.0902', '7.000', '0.7081', 1, 1, 1, 1, 1726090961.6619709]
VI_at__the_End : ['1.202', '0.4947', '1.800', '0.1401', '1.800', '0.1136', '7.000', '0.7086', 1, 1, 1, 1, 1726091022.6650457]