TEST_NAME : Wafer
TEST_DATE : 24_09_11-23_40_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-015-015-00 | FUSED_ID : 6359364768398110960
  IC_TEMP :  -48.96 | VDDM : 1140.95 | AUX_INT :   -6.94 | CsaBias :   94.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00575e-03 / 2
  ADC_P0  : -6.94039e-03 ± 2.14516e-02
  ADC_P1  : 7.90192e-03 ± 4.95267e-04
  ADC_P2  : -5.27390e-06 ± 2.26716e-06
  CSA_Chi2/NDF : 6.11378e-05 / 2
  CSA_P0  : 5.77710e-02 ± 5.21528e-03
  CSA_P1  : 9.17190e-03 ± 3.92933e-04
  CSA_P2  : -3.34154e-05 ± 5.98391e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [8, 43, 82, 91, 114, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [5, 22, 29, 44, 56, 73, 91, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2435', '1.800', '0.1829', '1.800', '0.0833', '7.000', '0.7078', 1, 1, 1, 1, 1726090856.2575946]
VI_after__Init : ['1.202', '0.2435', '1.800', '0.1829', '1.800', '0.0789', '7.000', '0.7077', 1, 1, 1, 1, 1726090864.3008685]
VI_at__the_End : ['1.202', '0.5002', '1.800', '0.1379', '1.800', '0.1104', '7.000', '0.7086', 1, 1, 1, 1, 1726090933.2323864]