TEST_NAME : Wafer
TEST_DATE : 24_09_11-23_26_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-015-024-07 | FUSED_ID : 6359364768398111111
  IC_TEMP :  -51.42 | VDDM : 1125.07 | AUX_INT :   -6.97 | CsaBias :   91.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02998e-03 / 2
  ADC_P0  : -6.96607e-03 ± 2.17392e-02
  ADC_P1  : 8.29720e-03 ± 5.34029e-04
  ADC_P2  : -5.58962e-06 ± 2.58965e-06
  CSA_Chi2/NDF : 9.66733e-05 / 2
  CSA_P0  : 5.76232e-02 ± 6.55806e-03
  CSA_P1  : 9.48375e-03 ± 4.94103e-04
  CSA_P2  : -3.69035e-05 ± 7.52460e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [2, 12, 53, 66, 81, 115, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [2, 12, 56, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4639', '1.800', '0.1417', '1.800', '0.0989', '7.000', '0.7078', 1, 1, 1, 1, 1726089983.6734023]
VI_after__Init : ['1.201', '0.4639', '1.800', '0.1417', '1.800', '0.0931', '7.000', '0.7080', 1, 1, 1, 1, 1726089991.7438157]
VI_at__the_End : ['1.201', '0.5049', '1.800', '0.1364', '1.800', '0.1114', '7.000', '0.7087', 1, 1, 1, 1, 1726090059.3914251]