TEST_NAME : Wafer
TEST_DATE : 24_09_12-00_00_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-016-006-08 | FUSED_ID : 6359364768398114920
  IC_TEMP :  -56.20 | VDDM : 1119.31 | AUX_INT :   -7.10 | CsaBias :   75.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07317e-03 / 2
  ADC_P0  : -7.09640e-03 ± 2.21636e-02
  ADC_P1  : 8.36546e-03 ± 5.40380e-04
  ADC_P2  : -5.99883e-06 ± 2.61083e-06
  CSA_Chi2/NDF : 1.64279e-04 / 2
  CSA_P0  : 5.68978e-02 ± 8.54897e-03
  CSA_P1  : 1.00485e-02 ± 6.44103e-04
  CSA_P2  : -4.82864e-05 ± 9.80893e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [10, 15, 39, 75, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [15, 17, 78, 79, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3643', '1.800', '0.1725', '1.800', '0.0975', '7.000', '0.7080', 1, 1, 1, 1, 1726092018.9675364]
VI_after__Init : ['1.202', '0.3634', '1.800', '0.1725', '1.800', '0.0922', '7.000', '0.7080', 1, 1, 1, 1, 1726092027.224972]
VI_at__the_End : ['1.202', '0.4931', '1.800', '0.1366', '1.800', '0.1153', '7.000', '0.7086', 1, 1, 1, 1, 1726092092.076745]