TEST_NAME : Wafer
TEST_DATE : 24_09_12-00_01_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-016-007-08 | FUSED_ID : 6359364768398114936
  IC_TEMP :  -51.97 | VDDM : 1129.10 | AUX_INT :   -6.31 | CsaBias :   82.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.92176e-04 / 2
  ADC_P0  : -6.31275e-03 ± 2.13357e-02
  ADC_P1  : 8.12299e-03 ± 5.15190e-04
  ADC_P2  : -5.14686e-06 ± 2.46259e-06
  CSA_Chi2/NDF : 8.12602e-05 / 2
  CSA_P0  : 5.95081e-02 ± 6.01259e-03
  CSA_P1  : 9.37998e-03 ± 4.53005e-04
  CSA_P2  : -3.66552e-05 ± 6.89873e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [0, 4, 18, 25, 48, 57, 67, 88]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [15, 33, 34, 36, 81]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3803', '1.800', '0.1664', '1.800', '0.0928', '7.000', '0.7079', 1, 1, 1, 1, 1726092116.4988685]
VI_after__Init : ['1.202', '0.3803', '1.800', '0.1665', '1.800', '0.0870', '7.000', '0.7079', 1, 1, 1, 1, 1726092125.318315]
VI_at__the_End : ['1.202', '0.5018', '1.800', '0.1364', '1.800', '0.1114', '7.000', '0.7086', 1, 1, 1, 1, 1726092187.275356]