TEST_NAME : Wafer
TEST_DATE : 24_09_12-00_08_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-016-011-08 | FUSED_ID : 6359364768398115000
  IC_TEMP :  -47.96 | VDDM : 1136.72 | AUX_INT :   -6.35 | CsaBias :   85.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00793e-03 / 2
  ADC_P0  : -6.34712e-03 ± 2.15353e-02
  ADC_P1  : 7.70038e-03 ± 4.98301e-04
  ADC_P2  : -4.21901e-06 ± 2.28975e-06
  CSA_Chi2/NDF : 8.76360e-05 / 2
  CSA_P0  : 5.98446e-02 ± 6.24401e-03
  CSA_P1  : 9.22332e-03 ± 4.70441e-04
  CSA_P2  : -3.42157e-05 ± 7.16426e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [15, 79, 82, 101, 103, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [11, 84, 87, 91, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2208', '1.800', '0.1811', '1.800', '0.0848', '7.000', '0.7080', 1, 1, 1, 1, 1726092505.6174593]
VI_after__Init : ['1.202', '0.2208', '1.800', '0.1811', '1.800', '0.0790', '7.000', '0.7079', 1, 1, 1, 1, 1726092513.6749773]
VI_at__the_End : ['1.202', '0.5022', '1.800', '0.1370', '1.800', '0.1100', '7.000', '0.7090', 1, 1, 1, 1, 1726092573.6152883]