TEST_NAME : Wafer
TEST_DATE : 24_09_12-00_10_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-016-012-08 | FUSED_ID : 6359364768398115016
  IC_TEMP :  -51.46 | VDDM : 1130.04 | AUX_INT : -119.25 | CsaBias :    3.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.74562e-04 / 2
  ADC_P0  : -1.19246e-01 ± 2.62157e-02
  ADC_P1  : 9.55377e-03 ± 5.87726e-04
  ADC_P2  : -1.06707e-05 ± 2.57417e-06
  CSA_Chi2/NDF : 1.05334e-04 / 2
  CSA_P0  : 5.65523e-02 ± 6.84551e-03
  CSA_P1  : 9.44643e-03 ± 5.15760e-04
  CSA_P2  : -3.87453e-05 ± 7.85441e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [11, 73, 77, 82, 85, 92]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [79, 85, 105, 106, 109, 118, 121, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3894', '1.800', '0.1321', '1.800', '0.0912', '7.000', '0.7081', 1, 1, 1, 1, 1726092602.839996]
VI_after__Init : ['1.202', '0.3893', '1.800', '0.1321', '1.800', '0.0856', '7.000', '0.7079', 1, 1, 1, 1, 1726092611.0183692]
VI_at__the_End : ['1.202', '0.4944', '1.800', '0.1359', '1.800', '0.1118', '7.000', '0.7087', 1, 1, 1, 1, 1726092681.1661801]