TEST_NAME : Wafer
TEST_DATE : 24_09_12-00_11_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-016-013-08 | FUSED_ID : 6359364768398115032
  IC_TEMP :  -48.38 | VDDM : 1125.50 | AUX_INT :   -6.93 | CsaBias :   78.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01369e-03 / 2
  ADC_P0  : -6.93365e-03 ± 2.15234e-02
  ADC_P1  : 7.78299e-03 ± 4.86028e-04
  ADC_P2  : -5.35301e-06 ± 2.17224e-06
  CSA_Chi2/NDF : 6.43612e-05 / 2
  CSA_P0  : 5.85466e-02 ± 5.35099e-03
  CSA_P1  : 8.99252e-03 ± 4.03159e-04
  CSA_P2  : -3.32508e-05 ± 6.13963e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [1, 31, 61, 71, 109, 116]
 | N_BROKEN_SLOW :  [2]
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [0, 2, 12, 47, 50, 56, 80, 109, 110]
 | P_BROKEN_SLOW :  [2]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3230', '1.800', '0.1496', '1.800', '0.0914', '7.000', '0.7079', 1, 1, 1, 1, 1726092699.975881]
VI_after__Init : ['1.202', '0.3233', '1.800', '0.1491', '1.800', '0.0860', '7.000', '0.7078', 1, 1, 1, 1, 1726092708.82322]
VI_at__the_End : ['1.202', '0.4904', '1.800', '0.1347', '1.800', '0.1104', '7.000', '0.7086', 1, 1, 1, 1, 1726092772.440542]