TEST_NAME : Wafer
TEST_DATE : 24_09_12-00_14_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-016-015-08 | FUSED_ID : 6359364768398115064
  IC_TEMP :  -50.28 | VDDM : 1138.04 | AUX_INT :   -9.80 | CsaBias :   91.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39063e-03 / 2
  ADC_P0  : -9.79626e-03 ± 2.52395e-02
  ADC_P1  : 7.86761e-03 ± 5.75662e-04
  ADC_P2  : -5.06543e-06 ± 2.62632e-06
  CSA_Chi2/NDF : 8.92407e-05 / 2
  CSA_P0  : 5.95528e-02 ± 6.30092e-03
  CSA_P1  : 9.21098e-03 ± 4.74729e-04
  CSA_P2  : -3.37098e-05 ± 7.22956e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [2, 42, 76, 80, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [4, 26, 40, 61, 105, 114, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3043', '1.800', '0.1709', '1.800', '0.0876', '7.000', '0.7078', 1, 1, 1, 1, 1726092893.9914885]
VI_after__Init : ['1.202', '0.3043', '1.800', '0.1707', '1.800', '0.0818', '7.000', '0.7079', 1, 1, 1, 1, 1726092902.158888]
VI_at__the_End : ['1.202', '0.5018', '1.800', '0.1351', '1.800', '0.1104', '7.000', '0.7086', 1, 1, 1, 1, 1726092972.6577098]