TEST_NAME : Wafer
TEST_DATE : 24_09_12-00_21_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-016-019-15 | FUSED_ID : 6359364768398115135
  IC_TEMP :  -59.46 | VDDM : 1125.83 | AUX_INT :  -60.71 | CsaBias :   34.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.75381e-03 / 2
  ADC_P0  : -6.07081e-02 ± 3.15490e-02
  ADC_P1  : 8.69169e-03 ± 7.23344e-04
  ADC_P2  : -7.48062e-06 ± 3.27225e-06
  CSA_Chi2/NDF : 1.43094e-04 / 2
  CSA_P0  : 5.53764e-02 ± 7.97873e-03
  CSA_P1  : 9.79866e-03 ± 6.01139e-04
  CSA_P2  : -4.68382e-05 ± 9.15464e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [101, 102, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [36, 81, 112, 124, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3400', '1.800', '0.1220', '1.800', '0.0894', '7.000', '0.7086', 1, 1, 1, 1, 1726093281.3443928]
VI_after__Init : ['1.202', '0.3400', '1.800', '0.1221', '1.800', '0.0817', '7.000', '0.7078', 1, 1, 1, 1, 1726093289.3778229]
VI_at__the_End : ['1.202', '0.4821', '1.800', '0.1340', '1.800', '0.1134', '7.000', '0.7090', 1, 1, 1, 1, 1726093355.123771]