TEST_NAME : Wafer
TEST_DATE : 24_09_12-00_27_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-016-023-15 | FUSED_ID : 6359364768398115199
  IC_TEMP :  -51.85 | VDDM : 1133.81 | AUX_INT :   -8.39 | CsaBias :   92.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53039e-03 / 2
  ADC_P0  : -8.38560e-03 ± 2.65843e-02
  ADC_P1  : 7.81905e-03 ± 6.20298e-04
  ADC_P2  : -4.50114e-06 ± 2.87284e-06
  CSA_Chi2/NDF : 8.49692e-05 / 2
  CSA_P0  : 5.87936e-02 ± 6.14827e-03
  CSA_P1  : 9.24305e-03 ± 4.63228e-04
  CSA_P2  : -3.36970e-05 ± 7.05442e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [5, 17, 33, 49]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [34, 39, 68, 71, 75, 86, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0594', '1.800', '0.1128', '1.800', '0.0773', '7.000', '0.7079', 1, 1, 1, 1, 1726093669.6867068]
VI_after__Init : ['1.202', '0.0594', '1.800', '0.1137', '1.800', '0.0717', '7.000', '0.7079', 1, 1, 1, 1, 1726093677.7490947]
VI_at__the_End : ['1.202', '0.5042', '1.800', '0.1363', '1.800', '0.1119', '7.000', '0.7092', 1, 1, 1, 1, 1726093748.9756503]