TEST_NAME : Wafer
TEST_DATE : 24_09_12-00_52_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-017-008-05 | FUSED_ID : 6359364768398119045
  IC_TEMP :  -55.22 | VDDM : 1116.83 | AUX_INT :  -25.37 | CsaBias :   68.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16299e-03 / 2
  ADC_P0  : -2.53720e-02 ± 2.38967e-02
  ADC_P1  : 8.63301e-03 ± 5.77549e-04
  ADC_P2  : -7.07804e-06 ± 2.75104e-06
  CSA_Chi2/NDF : 1.25882e-04 / 2
  CSA_P0  : 5.72530e-02 ± 7.48349e-03
  CSA_P1  : 9.32191e-03 ± 5.63827e-04
  CSA_P2  : -3.91565e-05 ± 8.58642e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [4, 18, 22, 94, 116, 120, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [3, 26, 61, 63, 80, 116, 119, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1770', '1.800', '0.1264', '1.800', '0.0903', '7.000', '0.7083', 1, 1, 1, 1, 1726095125.942487]
VI_after__Init : ['1.202', '0.1769', '1.800', '0.1264', '1.800', '0.0824', '7.000', '0.7072', 1, 1, 1, 1, 1726095134.115937]
VI_at__the_End : ['1.202', '0.4852', '1.800', '0.1363', '1.800', '0.1145', '7.000', '0.7084', 1, 1, 1, 1, 1726095192.1147125]