TEST_NAME : Wafer
TEST_DATE : 24_09_12-00_48_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-017-010-05 | FUSED_ID : 6359364768398119077
  IC_TEMP :  -49.84 | VDDM : 1118.60 | AUX_INT :   -8.69 | CsaBias :   92.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36837e-03 / 2
  ADC_P0  : -8.69463e-03 ± 2.50849e-02
  ADC_P1  : 7.83544e-03 ± 5.77552e-04
  ADC_P2  : -4.93663e-06 ± 2.63994e-06
  CSA_Chi2/NDF : 7.69345e-05 / 2
  CSA_P0  : 5.65935e-02 ± 5.85037e-03
  CSA_P1  : 9.35103e-03 ± 4.40783e-04
  CSA_P2  : -3.70689e-05 ± 6.71260e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [87, 95, 100, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [79, 89, 96, 99]
 | P_BROKEN_SLOW :  [73]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3825', '1.800', '0.1629', '1.800', '0.0939', '7.000', '0.7086', 1, 1, 1, 1, 1726094930.8171532]
VI_after__Init : ['1.201', '0.3823', '1.800', '0.1629', '1.800', '0.0863', '7.000', '0.7075', 1, 1, 1, 1, 1726094938.9876096]
VI_at__the_End : ['1.202', '0.4955', '1.800', '0.1374', '1.800', '0.1111', '7.000', '0.7082', 1, 1, 1, 1, 1726094997.7285922]