TEST_NAME : Wafer
TEST_DATE : 24_09_12-00_47_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-017-011-05 | FUSED_ID : 6359364768398119093
  IC_TEMP :  -58.63 | VDDM : 1125.20 | AUX_INT :   -5.84 | CsaBias :   79.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.82279e-04 / 2
  ADC_P0  : -5.84449e-03 ± 2.01206e-02
  ADC_P1  : 7.81616e-03 ± 4.69330e-04
  ADC_P2  : -4.66970e-06 ± 2.16742e-06
  CSA_Chi2/NDF : 9.50150e-05 / 2
  CSA_P0  : 5.60262e-02 ± 6.50157e-03
  CSA_P1  : 9.26417e-03 ± 4.89847e-04
  CSA_P2  : -4.03990e-05 ± 7.45978e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [3, 53, 84, 94, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [11, 41, 63, 65, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2742', '1.800', '0.1231', '1.800', '0.0863', '7.000', '0.7085', 1, 1, 1, 1, 1726094833.531897]
VI_after__Init : ['1.202', '0.2737', '1.800', '0.1230', '1.800', '0.0792', '7.000', '0.7074', 1, 1, 1, 1, 1726094842.3003128]
VI_at__the_End : ['1.202', '0.4759', '1.800', '0.1336', '1.800', '0.1111', '7.000', '0.7085', 1, 1, 1, 1, 1726094907.7287264]