TEST_NAME : Wafer
TEST_DATE : 24_09_12-00_39_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-017-016-02 | FUSED_ID : 6359364768398119170
  IC_TEMP :  -53.83 | VDDM : 1130.16 | AUX_INT :   -8.06 | CsaBias :   84.72
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22196e-03 / 2
  ADC_P0  : -8.05558e-03 ± 2.37284e-02
  ADC_P1  : 7.78422e-03 ± 5.50798e-04
  ADC_P2  : -4.43824e-06 ± 2.54213e-06
  CSA_Chi2/NDF : 1.08339e-04 / 2
  CSA_P0  : 5.92915e-02 ± 6.94248e-03
  CSA_P1  : 9.69985e-03 ± 5.23066e-04
  CSA_P2  : -4.09021e-05 ± 7.96568e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [56, 67, 84, 93, 94, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [7, 27, 89, 118, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2871', '1.800', '0.1710', '1.800', '0.0901', '7.000', '0.7081', 1, 1, 1, 1, 1726094348.9934165]
VI_after__Init : ['1.202', '0.2870', '1.800', '0.1711', '1.800', '0.0842', '7.000', '0.7079', 1, 1, 1, 1, 1726094357.7588403]
VI_at__the_End : ['1.202', '0.5043', '1.800', '0.1363', '1.800', '0.1116', '7.000', '0.7088', 1, 1, 1, 1, 1726094417.203174]